Decentralized network for next generation sensor integration and edge computing

Abstract

Semiconductor product cost and quality are significantly impacted by in-line inspection cycle times and on- board process sensors. There have been considerable software and hardware developments that have helped achieve our present day metrics but those are continuously being challenged. These developments have been through the OEM and manufacturing client joint development cycle which can be months or years long. To continue innovation and reduce the development cycle, a decentralized network for fast sensor integration and data management needs to be implemented.