{"title":"Case Report on Semiconductor Company ABCtronics","authors":"Duwei Xiang","doi":"10.1109/CBFD52659.2021.00080","DOIUrl":null,"url":null,"abstract":"In semiconductor production lines, uncertainties about the health of processes and wafers usually lead to \"major scrap events\" and higher costs. The industry focuses on quality assurance processes. ABCtronics’ plant is facing the problem of downtime which is a matter of concern for semiconductor companies. By observation, the pattern follows Gamma distribution. Thus, the ion-implanter of the IC chips ought to be replaced. After calculations of Beta Distribution are done, it shows that the company’s original fabrication process is in good shape. The QRT has proposed a quality control policy Chip Testing Method (ICTM) to replace the existing policy Individual Lot Acceptance Testing Method (LATM). There are two types of distributions chosen, Hypergeometric and Beta Distribution. Both shows that the new manufacturing technology adopted by ICTM can effectively improve the accepted rate of chips. From observing our data, we know that the time before IC chip failure (in years) is exponentially distributed. There is a very high chance that ABCtronics will meet the expectations of PQRsystems for having a product lifetime of 6 years or higher. Multiple linear regression model has better explanatory power. We consider the industry overall is experiencing a medium level demand.","PeriodicalId":230625,"journal":{"name":"2021 International Conference on Computer, Blockchain and Financial Development (CBFD)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 International Conference on Computer, Blockchain and Financial Development (CBFD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CBFD52659.2021.00080","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In semiconductor production lines, uncertainties about the health of processes and wafers usually lead to "major scrap events" and higher costs. The industry focuses on quality assurance processes. ABCtronics’ plant is facing the problem of downtime which is a matter of concern for semiconductor companies. By observation, the pattern follows Gamma distribution. Thus, the ion-implanter of the IC chips ought to be replaced. After calculations of Beta Distribution are done, it shows that the company’s original fabrication process is in good shape. The QRT has proposed a quality control policy Chip Testing Method (ICTM) to replace the existing policy Individual Lot Acceptance Testing Method (LATM). There are two types of distributions chosen, Hypergeometric and Beta Distribution. Both shows that the new manufacturing technology adopted by ICTM can effectively improve the accepted rate of chips. From observing our data, we know that the time before IC chip failure (in years) is exponentially distributed. There is a very high chance that ABCtronics will meet the expectations of PQRsystems for having a product lifetime of 6 years or higher. Multiple linear regression model has better explanatory power. We consider the industry overall is experiencing a medium level demand.