X-ray Spectroscopy and Total Yield Measurements on a Microsecond X-Pinch

G. S. Jaar, R. K. Appartaim
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Abstract

Emission spectra from a microsecond x-pinch were studied in the soft x-ray region which give information about the radiating hot spot plasma. The spectra were collected using a flat crystal spectrometer from aluminum and molybdenum in a 2×25 µm wire x-pinch configuration. We present results that show aluminum reaching the hydrogen-like state and molybdenum reaching the neon-like charge state, from which relevant plasma parameters are determined. We also present the results of a load optimization study for an x-pinch driven by a 350-kA microsecond generator. A scan of the configuration space across material, thickness, and number of wires was performed to determine which parameter combination creates the best total x-ray yield for use in radiography and backlighting. The configuration assessment was conducted using x-ray imaging, Si photodiodes, and diamond radiation detectors.
在微秒x -夹点上的x射线光谱学和总产率测量
在软x射线区域研究了微秒x-夹点的发射光谱,给出了辐射热点等离子体的信息。在2×25µm线x夹紧配置下,用平面晶体光谱仪收集铝和钼的光谱。我们提出的结果表明,铝达到类氢态,钼达到类氖电荷态,由此确定了相关的等离子体参数。我们还介绍了由350-kA微秒发电机驱动的x-pinch的负载优化研究结果。对材料、厚度和导线数量的配置空间进行扫描,以确定哪种参数组合可以产生最佳的x射线总良率,用于射线照相和背光。使用x射线成像、Si光电二极管和金刚石辐射探测器进行结构评估。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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