Characteristics of shielded microstrip with finite conductivity and finite strip thickness

Abstract

An accurate full-wave mode matching approach is used to analyze the dispersion characteristics of shielded microstrip. In contrast to the usual perturbation method it includes metallic loss by a self-consistent description without skin effect approximation. The analysis holds for arbitrary high losses and also for metallization dimensions smaller than the skin depth. The metallic strip is considered to be of finite conductivity with finite metallization thickness. The substrate used is GaAs.