Detecting Failed Elements in an Arbitrary Antenna Array using Machine Learning

L. de Lange, D. Ludick, T. Grobler
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引用次数: 5

Abstract

The failure of antenna array elements leads to inaccurate far-field radiation patterns. When failed elements are present in an antenna array used for sensitive applications, it will compromise the measured data, which may severely affect the end-result. Identifying faulty elements is therefore important for the system health management of the antenna array. In [2], Feedforward Neural Networks (FNNs) were used to classify failure scenarios in an antenna array, using the far-field radiation pattern. Different methods of sampling the far-field pattern were compared according to the resultant accuracy. In this article, Support Vector Machines (SVMs) with low degree polynomial kernels, as described in [1], are trained on datasets generated by different sampling methods. The work is tested on arbitrary array configuration simulations with an increasing number of elements, to investigate the possibility of using the SVM method described in [1] on large antenna arrays.
利用机器学习检测任意天线阵列中的失效元件
天线阵列元件的失效导致远场辐射方向图不准确。当用于敏感应用的天线阵列中存在失效元件时,它将危及测量数据,这可能严重影响最终结果。因此,识别故障元件对于天线阵列的系统健康管理非常重要。在[2]中,前馈神经网络(fnn)使用远场辐射方向图对天线阵列中的故障场景进行分类。比较了不同的远场方向图采样方法的精度。本文使用[1]中描述的低次多项式核的支持向量机(svm)在不同采样方法生成的数据集上进行训练。该工作在任意阵列配置模拟中进行了测试,其中包含越来越多的元素,以研究在大型天线阵列上使用[1]中描述的SVM方法的可能性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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