Investigation of Effects of Thermal Ageing on Dielectric Properties of Low Voltage Cable Samples by using Dielectric Response Analyzer

Abstract

Cables are arguably one of the main components of low voltage distribution systems. It is known that the majority of low voltage cable network was built some decades ago. The cables are exposed to different stresses by then. Due to the stresses, the cable insulation is damaged, which leads to failures. In this work, 0,6/1kV SZRMtKVM-J 4 x 6 mm PVC insulated cable samples were subjected to 3 rounds thermal stress at 110°C. The duration of each round is 6 hours. The effect of thermal stress on $tan \delta$ and capacitance is investigated. Dirana Dielectric Insulation Analyzer by Omicron is used. The preliminary results of the ongoing laboratory experiment are presented in this paper.