M. Hashizume, Yutaka Hata, H. Yotsuyanagi, Y. Miura
{"title":"A supply current testable register string DAC of decoder type","authors":"M. Hashizume, Yutaka Hata, H. Yotsuyanagi, Y. Miura","doi":"10.1109/ISCIT.2011.6092183","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a supply current testable resistor string DAC of decoder type whose area overhead is small and a supply current test method. Open defects and short ones in the DAC can be detected by the test method with about 50% of the exhausted test vectors. It is shown by some experiments that most of the targeted defects in our testable DACs of 4 and 8 bits can be detected by the test method.","PeriodicalId":226552,"journal":{"name":"2011 11th International Symposium on Communications & Information Technologies (ISCIT)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2011-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 11th International Symposium on Communications & Information Technologies (ISCIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCIT.2011.6092183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, we propose a supply current testable resistor string DAC of decoder type whose area overhead is small and a supply current test method. Open defects and short ones in the DAC can be detected by the test method with about 50% of the exhausted test vectors. It is shown by some experiments that most of the targeted defects in our testable DACs of 4 and 8 bits can be detected by the test method.