{"title":"On the Influence of Impedance Matching for the Sensitivity of Reflection Phase Measurements with Resonant Sensors","authors":"Birk Hattenhorst, T. Musch","doi":"10.23919/apmc55665.2022.9999867","DOIUrl":null,"url":null,"abstract":"In this contribution, the influence of impedance matching for sensors that incorporate phase measurements in a one-port reflection setup is elaborated in detail. The developed theoretical basis is validated by three-dimensional electromagnetic simulations that are corroborated by reflection measurements of a metamaterial-based, resonant near-field sensor with varying impedance matching conditions.","PeriodicalId":219307,"journal":{"name":"2022 Asia-Pacific Microwave Conference (APMC)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Asia-Pacific Microwave Conference (APMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/apmc55665.2022.9999867","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this contribution, the influence of impedance matching for sensors that incorporate phase measurements in a one-port reflection setup is elaborated in detail. The developed theoretical basis is validated by three-dimensional electromagnetic simulations that are corroborated by reflection measurements of a metamaterial-based, resonant near-field sensor with varying impedance matching conditions.