Embedded metallic nanoparticles for on-chip infrared detection

Shiyang Zhu, G. Lo, D. Kwong
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Abstract

Conventional silicide Schottky barrier photodetector suffers from low responsivity due to the low emission probability of photoexcited hot carriers from the silicide layer to the Si layer. The photoexcited carriers in metallic nanoparticle may have large emission probability because they meet the metal/Si interface at all directions. Moreover, the light absorption by the metallic nanoparticles may also be dramatically enhanced due to excitation of localized surface plasmon resonance. A proof-of-concept detector based on the embedded Ni silicide nanopaticles are fabricated using standard CMOS technology. It exhibits a peak responsivity of ~30 mA/W and a 3-dB bandwidth of ~6 GHz. The approaches to improve the performance are addressed.
用于片上红外探测的嵌入式金属纳米颗粒
传统的硅化肖特基势垒光电探测器由于光激发热载流子从硅化层向硅层发射的概率较低而存在响应率低的问题。金属纳米粒子中的光激发载流子由于在各个方向上都与金属/硅界面相遇而具有较大的发射概率。此外,由于局部表面等离子体共振的激发,金属纳米粒子的光吸收也可能显著增强。基于嵌入式硅化镍纳米粒子的概念验证探测器采用标准的CMOS技术制造。它的峰值响应度为~ 30ma /W, 3db带宽为~ 6ghz。讨论了提高性能的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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