Exploiting FPGA-based techniques for fault injection campaigns on VLSI circuits

P. Civera, L. Macchiarulo, M. Rebaudengo, M. Reorda, M. Violante
{"title":"Exploiting FPGA-based techniques for fault injection campaigns on VLSI circuits","authors":"P. Civera, L. Macchiarulo, M. Rebaudengo, M. Reorda, M. Violante","doi":"10.1109/DFTVS.2001.966777","DOIUrl":null,"url":null,"abstract":"Proposes an FPGA-based system to speed-up fault injection campaigns for the evaluation of the fault-tolerant capabilities of VLSI circuits. An environment is described, relying on FPGA-based emulation of the circuit. Suitable techniques are described, allowing one to emulate the effects of faults and to observe faulty behavior. The proposed approach allows the combination of the speed of hardware-based techniques, and the flexibility of simulation-based techniques. Experimental results are provided showing that significant speed-up figures with respect to state-of-the-art simulation-based techniques can be achieved.","PeriodicalId":187031,"journal":{"name":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"60","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.2001.966777","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 60

Abstract

Proposes an FPGA-based system to speed-up fault injection campaigns for the evaluation of the fault-tolerant capabilities of VLSI circuits. An environment is described, relying on FPGA-based emulation of the circuit. Suitable techniques are described, allowing one to emulate the effects of faults and to observe faulty behavior. The proposed approach allows the combination of the speed of hardware-based techniques, and the flexibility of simulation-based techniques. Experimental results are provided showing that significant speed-up figures with respect to state-of-the-art simulation-based techniques can be achieved.
利用基于fpga的技术在VLSI电路上进行故障注入活动
提出了一种基于fpga的系统来加速故障注入活动,以评估VLSI电路的容错能力。描述了一种基于fpga的电路仿真环境。描述了适当的技术,使人们能够模拟故障的影响并观察故障行为。所提出的方法结合了基于硬件技术的速度和基于仿真技术的灵活性。实验结果表明,相对于最先进的基于仿真的技术,可以实现显著的加速数字。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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