Comparing the dynamic behavior between LFSRs and counting techniques

Abstract

Transition counting is one of the schemes which is used for testing digital circuits. A relation for the aliasing error probability has been deduced which depends on the length of the input pattern. Previously, we have proved that the final value for aliasing error probability for both linear and counting techniques are similar. However, the practical results indicate that the linear technique has a better performance than the counting technique. We study the dynamic behavior for the counting technique. The results are discussed and compared with the results obtained from the linear technique which supports the empirical and practical conclusions for the superiority of the LFSR.