Energy recovery circuit for testing high average power

IEEE Conference Record of the 1988 Eighteenth Power Modulator Symposium Pub Date : 1988-06-20 DOI:10.1109/MODSYM.1988.26257

R.N. Hithcock

引用次数: 1

Abstract

In high-average-power, high-repetition modulator systems, component testing requires a suitable testbed to perform validation and lifetime tests. The author describes a circuit for testing high-average-power components. Design information is given to show how to build a testbed that will operate at an overall power gain, defined as the power the switches operate at divided by the input power, of 10 to 20. Circuit losses are analyzed. The advantages and disadvantages of this type of circuit are discussed.<>

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用于测试高平均功率的能量回收电路

在高平均功率、高重复频率的调制器系统中，组件测试需要一个合适的测试平台来执行验证和寿命测试。介绍了一种高平均功率元器件的测试电路。设计信息给出了如何建立一个试验台，它将在总功率增益下工作，定义为开关工作时的功率除以输入功率，10到20。分析了电路损耗。讨论了这种电路的优点和缺点。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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IEEE Conference Record of the 1988 Eighteenth Power Modulator Symposium

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