High order graphlets for pattern classification

Anjan Dutta, H. Sahbi
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引用次数: 1

Abstract

Graph-based methods are known to be successful for pattern description and comparison. Their general principle consists in using graphs to model local features as well as their structural relationships and achieving pattern comparison with graph matching. Among these methods, subgraph isomorphism is particularly effective but intractable for general and unconstrained graph structures. In this paper, we introduce an efficient and effective method for graph-based pattern comparison. The main contribution includes a new stochastic search procedure that allows us to efficiently extract, hash and measure the distribution of increasing order subgraphs (a.k.a graphlets) in large graph collections. We consider both low and high order graphlets in order to model local features as well as their complex interactions. These graphlets are partitioned into sets of isomorphic and non-isomorphic subgraphs using well designed hash functions with a low probability of collision; resulting into accurate graph descriptions. When combined with support vector machines, these high order graphlet-based descriptions have positive impact on the performance of pattern comparison and classification as corroborated through experiments on different standard databases.
用于模式分类的高阶石墨
众所周知,基于图的方法在模式描述和比较方面是成功的。它们的一般原理是使用图来建模局部特征及其结构关系,并通过图匹配实现模式比较。在这些方法中,子图同构对于一般的无约束图结构尤其有效,但难以解决。本文介绍了一种高效的基于图的模式比较方法。主要贡献包括一个新的随机搜索过程,它允许我们在大型图集合中有效地提取、散列和测量递增阶子图(又名graphlet)的分布。我们考虑了低阶和高阶石墨烯,以便对局部特征及其复杂的相互作用进行建模。使用设计良好的低碰撞概率哈希函数将这些小图划分为同构和非同构子图集;得到准确的图形描述。结合支持向量机,这些基于高阶石墨烯的描述对模式比较和分类的性能产生了积极的影响,并通过不同标准数据库的实验得到了证实。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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