{"title":"Chlorinated solvent elimination in chip capacitor attach using qualification by comparison","authors":"J. A. Steele, K. B. Gould, D.G. Siden, H. Simmons","doi":"10.1109/IEMT.1993.398206","DOIUrl":null,"url":null,"abstract":"The qualification of a no-clean solder paste eliminate the use of chlorofluorocarbons (CFCs) in semiconductor manufacturing. The no-clean also reduces chemical usage and capital equipment needs. The no-clean paste selection process proves successful. Qualification by comparison provides an effective way to ensure the needed reliability.<<ETX>>","PeriodicalId":206206,"journal":{"name":"Proceedings of 15th IEEE/CHMT International Electronic Manufacturing Technology Symposium","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 15th IEEE/CHMT International Electronic Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1993.398206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The qualification of a no-clean solder paste eliminate the use of chlorofluorocarbons (CFCs) in semiconductor manufacturing. The no-clean also reduces chemical usage and capital equipment needs. The no-clean paste selection process proves successful. Qualification by comparison provides an effective way to ensure the needed reliability.<>