Study on IoT and Big Data Analysis of 12” 7 nm Advanced Furnace Process Exhaust Gas Leakage

Kuo-Chi Chang, Kai-Chun Chu, Hsiao-Chuan Wang, Yuh-Chung Lin, Tsui-Lien Hsu, Yu-Wen Zhou
{"title":"Study on IoT and Big Data Analysis of 12” 7 nm Advanced Furnace Process Exhaust Gas Leakage","authors":"Kuo-Chi Chang, Kai-Chun Chu, Hsiao-Chuan Wang, Yuh-Chung Lin, Tsui-Lien Hsu, Yu-Wen Zhou","doi":"10.5772/intechopen.92849","DOIUrl":null,"url":null,"abstract":"Modern FAB uses a large number of high-energy processes, including plasma, CVD, and ion implantation. Furnaces are one of the important tools for semiconductor manufacturing. According to the requirements of conversion production management, FAB installed a set of IoT-based research based on 12″ 7 nm-level furnaces chip process. Two furnace processing tool measurement points were set up in a 12-inch 7 nm-level factory in Hsinchu Science Park, Taiwan, this is a 24-hour continuous monitoring system, the data obtained every second is sequentially send and stored in the cloud system. This study will be set in the cloud database for big data analysis and decision-making. The lower limit of TEOS, C2H4, CO is 0.4, 1.5, 1 ppm. Semiconductor process, so that IoT integration and big data operations can be performed in all processes, this is an important step to promote FAB intelligent production, and also an important contribution to this research.","PeriodicalId":343023,"journal":{"name":"Linked Open Data - Applications, Trends and Future Developments","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Linked Open Data - Applications, Trends and Future Developments","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5772/intechopen.92849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Modern FAB uses a large number of high-energy processes, including plasma, CVD, and ion implantation. Furnaces are one of the important tools for semiconductor manufacturing. According to the requirements of conversion production management, FAB installed a set of IoT-based research based on 12″ 7 nm-level furnaces chip process. Two furnace processing tool measurement points were set up in a 12-inch 7 nm-level factory in Hsinchu Science Park, Taiwan, this is a 24-hour continuous monitoring system, the data obtained every second is sequentially send and stored in the cloud system. This study will be set in the cloud database for big data analysis and decision-making. The lower limit of TEOS, C2H4, CO is 0.4, 1.5, 1 ppm. Semiconductor process, so that IoT integration and big data operations can be performed in all processes, this is an important step to promote FAB intelligent production, and also an important contribution to this research.
12 " 7 nm先进炉工艺废气泄漏物联网及大数据分析研究
现代FAB采用大量高能工艺,包括等离子体、CVD和离子注入。电炉是半导体制造的重要工具之一。根据转换生产管理的要求,FAB安装了一套基于物联网研究的12台″7纳米级熔炉芯片工艺。在台湾新竹科技园的一个12英寸7纳米级工厂内设置了两个炉加工工具测量点,这是一个24小时连续监测系统,每秒钟获得的数据依次发送并存储在云系统中。本研究将设置在云数据库中进行大数据分析和决策。TEOS、C2H4、CO的下限分别为0.4、1.5、1 ppm。半导体制程,使物联网集成和大数据操作可以在所有过程中进行,这是推动FAB智能化生产的重要一步,也是本研究的重要贡献。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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