A New Measurement Technique and Characterization Tool for Push-Pull Circuit Design

Abstract

The push-pull transistor is a 4-port device and so 4-port s-parameter data is needed to characterize it. In this paper, the authors will introduce a novel technique to measure s-parameters of a push-pull transistor. The technique uses TRL calibration method and employs a standard 2-port Vector Network Analyzer. The measured push-pull s-parameters are presented as a reduced 2-port s-parameter data set, which will enable the designer to use not only reflection, but transmission parameters as well in his design. So, push-pull circuits could be simulated for gain equalization, stability etc. and moreover could become a part of a larger simulation involving multiple stages. Finally, it allows push-pull circuits to be tuned and experimented with network analyzer displaying performance on a test bench in real-time.