The Effect of Doping and Temperature on DC Characteristics of InGaP/InGaAs/GaAs HEMT

Limali Sahoo, H. Palo
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Abstract

Dual-Channel HEMTs (DCHEMT) with multi-coupled delta-doped sheets can provide greater mobility, better sheet carrier density, and higher current driving capabilities. These DCHEMTs using compound materials such as InGaP/ InGaAs/ GaAs has the potential to provide broad microwave operation when associated with multi-delta doped sheets. This motivates the authors to propose and investigate one such dual-channel HEMT using the versatility of InGaP/InGaAs/ GaAs compound materials with graded triple delta-doped sheets. The microwave and Dual Channel (DC) characteristics are studied and compared based on the InGaP Schottky barrier layer and the triple delta-doped sheets using different doping densities. Results show a higher driving current with an increase in doping profile when the proposed structure is simulated using a 2-D ATLAS simulator from SILVACO.
掺杂和温度对InGaP/InGaAs/GaAs HEMT直流特性的影响
具有多耦合掺杂片的双通道hemt (DCHEMT)可以提供更高的迁移率,更好的片载流子密度和更高的电流驱动能力。这些dchemt使用复合材料,如InGaP/ InGaAs/ GaAs,当与多δ掺杂片相结合时,具有提供广泛微波操作的潜力。这促使作者提出并研究一种双通道HEMT,利用InGaP/InGaAs/ GaAs复合材料的通用性和梯度三重掺杂片。研究并比较了不同掺杂密度下InGaP肖特基势垒层和三δ掺杂片的微波和双通道特性。结果表明,利用SILVACO公司的二维ATLAS模拟器对该结构进行模拟时,驱动电流随着掺杂谱的增加而增加。
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