{"title":"Design and Development of FPGA based Firmware for Automated Test Equipment for DWGRU","authors":"Sai Srikar Dangeti, Anant Raut, Sumanth Sakkara","doi":"10.1109/RFM50841.2020.9344742","DOIUrl":null,"url":null,"abstract":"The new age of radar has been furnished with superior exciters and receivers to adapt to the risk in present day warfare situation. The risk in a military condition with interfacing signals requires a dependable signal generator unit and recipient unit, as to test the digital signal generator and collector unit a mechanized test gear is gainful as it will test the entire sign generator unit and give us a report of the presentation. In this paper, it involves the equipment foundation of the automated test equipment and interfacing with the interfaces present on the board. For configuration purpose Xilinx VC707 board's FPGA and interfaces on board are utilized. Therefore, utilization of IP cores available in the instrument and set forward the design of UART, PCI express and 10G Ethernet. The operating frequency of the ATE is from 2.5 GHz to 5.0 GHz.","PeriodicalId":138339,"journal":{"name":"2020 IEEE International RF and Microwave Conference (RFM)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International RF and Microwave Conference (RFM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFM50841.2020.9344742","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The new age of radar has been furnished with superior exciters and receivers to adapt to the risk in present day warfare situation. The risk in a military condition with interfacing signals requires a dependable signal generator unit and recipient unit, as to test the digital signal generator and collector unit a mechanized test gear is gainful as it will test the entire sign generator unit and give us a report of the presentation. In this paper, it involves the equipment foundation of the automated test equipment and interfacing with the interfaces present on the board. For configuration purpose Xilinx VC707 board's FPGA and interfaces on board are utilized. Therefore, utilization of IP cores available in the instrument and set forward the design of UART, PCI express and 10G Ethernet. The operating frequency of the ATE is from 2.5 GHz to 5.0 GHz.