VecMeter: Measuring Vectorization on the Xeon Phi

Joshua Peraza, Ananta Tiwari, W. A. Ward, R. Campbell, L. Carrington
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引用次数: 1

Abstract

Wide vector units in Intel's Xeon Phi accelerator cards can significantly boost application performance when used effectively. However, there is a lack of performance tools that provide programmers accurate information about the level of vectorization in their codes. This paper presents VecMeter, an easy-to-use tool to measure vectorization on the Xeon Phi. VecMeter utilizes binary instrumentation and therefore does not require source code modifications. This paper describes the design of VecMeter, demonstrates its accuracy, defines a metric for quantifying vectorization, and provides an example where the tool can guide code optimization to improve performance by up to 33%.
VecMeter:在Xeon Phi上测量矢量化
英特尔Xeon Phi加速卡中的宽矢量单元在有效使用时可以显着提高应用程序性能。然而,缺乏为程序员提供有关代码中向量化水平的准确信息的性能工具。本文介绍了VecMeter,一个易于使用的工具来测量Xeon Phi处理器上的矢量化。VecMeter使用二进制工具,因此不需要修改源代码。本文描述了VecMeter的设计,演示了其准确性,定义了量化向量化的度量,并提供了一个示例,该工具可以指导代码优化,将性能提高33%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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