Electromagnetic interference effects due to line reactor coil-to-coil short circuits

R. H. Potter
{"title":"Electromagnetic interference effects due to line reactor coil-to-coil short circuits","authors":"R. H. Potter","doi":"10.1109/RRCON.2002.1000110","DOIUrl":null,"url":null,"abstract":"The effect of coil-to-coil shorts on the impedance of line reactors has been an electromagnetic interference (EMI) safety issue for a number of years. This paper presents a comprehensive theoretical and experimental treatment of this issue. A circuit model was developed to evaluate the effects of coil-to-coil line reactor shorts. The circuit model was validated with experimental data. Potential failure mechanisms for coil-to-coil short circuits were developed and analyzed. Worst case values for potential shorts were established from experimental data. The system level effects for coil-to-coil short circuits were considered.","PeriodicalId":413474,"journal":{"name":"ASME/IEEE Joint Railroad Conference","volume":"77 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ASME/IEEE Joint Railroad Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RRCON.2002.1000110","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

The effect of coil-to-coil shorts on the impedance of line reactors has been an electromagnetic interference (EMI) safety issue for a number of years. This paper presents a comprehensive theoretical and experimental treatment of this issue. A circuit model was developed to evaluate the effects of coil-to-coil line reactor shorts. The circuit model was validated with experimental data. Potential failure mechanisms for coil-to-coil short circuits were developed and analyzed. Worst case values for potential shorts were established from experimental data. The system level effects for coil-to-coil short circuits were considered.
线路电抗器线圈对线圈短路引起的电磁干扰效应
多年来,线圈对线圈短路对线路电抗器阻抗的影响一直是一个电磁干扰(EMI)安全问题。本文对这一问题进行了全面的理论和实验处理。建立了一个电路模型来评估线圈对线圈线路电抗器短路的影响。用实验数据对电路模型进行了验证。提出并分析了线圈间短路的潜在失效机制。根据实验数据建立了潜在短路的最坏情况值。考虑了线圈间短路的系统级效应。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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