Ageing condition assessment of DC cable XLPE insulation by Tan δ measurement at 0.1 Hz voltage

Y. Liu, Yu-Hao Su, Linjie Wang, Yang Xiao
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引用次数: 6

Abstract

Although DC cable with XLPE insulation has entered the stage of high-speed development, the measuring and diagnostic techniques for DC cables are not well developed yet. Tan δ measurement at very low frequency has been found to be a useful method for ageing condition assessment of AC XLPE insulation. In this paper, investigations are carried out on two DC cables, a 320 kV new one and a 160 kV old one. The latter has finished its one-year prequalification test. Specimens are taken from different layers, that is, the inner, middle and outer layers of the XLPE insulation with a circumferential peeling method. Tan δ of the specimens are measured under four voltage levels of 0.1 Hz, determined according to the insulation thickness and operating voltages of DC cables. After the measurement, all tan d values are normalized by taking the middle layer as the reference. The result shows that for the new cable, the normalized tan δ of different insulation layers are all close to 1. Contrary to that, for the old cable, the normalized tan δ of the inner and outer insulation layers are larger than 1.5, and they increase significantly with the increase of the 0.1 Hz voltage. Beside, a supplementary test is performed on a 110 kV AC XLPE cable which has come out of service after 24-year operation. This test further verifies the feasibility of this method. The results show that the normalization method introduced here is effective for minimizing the adverse effects of system errors. The ageing condition of XLPE cable insulation can be reflected efficiently by the absolute values of normalized tan d, its increase with voltage rise, as well as the deviation among different layers.
0.1 Hz电压下Tan δ测量法评价直流电缆XLPE绝缘老化状况
虽然交联聚乙烯绝缘直流电缆已进入高速发展阶段,但直流电缆的检测和诊断技术还不发达。甚低频Tan δ测量是评价交流交联聚乙烯绝缘老化状况的有效方法。本文对两条直流电缆,一条320千伏的新电缆和一条160千伏的旧电缆进行了研究。后者已经完成了为期一年的资格预审。采用周向剥皮法对XLPE保温层的内层、中间层和外层进行取样。试样的Tan δ在0.1 Hz的4个电压等级下测量,根据直流电缆的绝缘厚度和工作电压确定。测量结束后,所有的tan d值以中间层为基准归一化。结果表明:对于新型电缆,不同绝缘层的归一化tan δ均接近于1。与此相反,旧电缆内外绝缘层的归一化tan δ均大于1.5,且随着0.1 Hz电压的升高而显著增大。此外,还对已服役24年的110kv交流交联聚乙烯电缆进行了补充试验。本次试验进一步验证了该方法的可行性。结果表明,本文所引入的归一化方法对于最小化系统误差的不利影响是有效的。通过归一化tan的绝对值、tan随电压升高的变化以及层间的偏差,可以有效地反映交联聚乙烯电缆绝缘的老化情况。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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