{"title":"An investigation into the effects of parasitic circuit inductance on partial discharge detection","authors":"M. Twiel, B. Stewart, I. Kemp","doi":"10.1109/EEIC.2001.965613","DOIUrl":null,"url":null,"abstract":"The effect of parasitic inductance associated with the standard partial discharge detection circuit is investigated in relation to the IEC270 standard calibration for detectors. The influence on calibrated detector sensitivity as a function of L and of calibration rise times t/sub r/ is presented. The results show that L can influence the detection circuit calibration in a way which is unappreciated, and as such may influence the evaluated apparent charge during discharge measurements.","PeriodicalId":228071,"journal":{"name":"Proceedings: Electrical Insulation Conference and Electrical Manufacturing and Coil Winding Conference (Cat. No.01CH37264)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings: Electrical Insulation Conference and Electrical Manufacturing and Coil Winding Conference (Cat. No.01CH37264)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EEIC.2001.965613","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
The effect of parasitic inductance associated with the standard partial discharge detection circuit is investigated in relation to the IEC270 standard calibration for detectors. The influence on calibrated detector sensitivity as a function of L and of calibration rise times t/sub r/ is presented. The results show that L can influence the detection circuit calibration in a way which is unappreciated, and as such may influence the evaluated apparent charge during discharge measurements.