Evaluation Method for Circuit Reliability Design of Board-level Electronic Products

C. Zhang, Fengming Lu, Wenzheng Xu
{"title":"Evaluation Method for Circuit Reliability Design of Board-level Electronic Products","authors":"C. Zhang, Fengming Lu, Wenzheng Xu","doi":"10.1109/SDPC.2019.00077","DOIUrl":null,"url":null,"abstract":"In order to quantitatively evaluate the circuit reliability design level of board-level electronic products, based on the four influencing factors of electrical stress derating design, tolerance design, signal/power integrity design and key function circuit design, the circuit reliability design evaluation method for board-level electronic products is proposed and application cases are given Firstly, based on the functional performance requirements and design information of the board-level circuit, the circuit reliability design evaluation criteria are proposed. Then, the evaluation parameters are extracted through simulation, testing, etc., and the reliability design level of the circuit is analyzed, and the quantitative evaluation results are given. Finally, the method is applied in the actual circuit, which proves the feasibility and effectiveness of the method.","PeriodicalId":403595,"journal":{"name":"2019 International Conference on Sensing, Diagnostics, Prognostics, and Control (SDPC)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Sensing, Diagnostics, Prognostics, and Control (SDPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SDPC.2019.00077","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

In order to quantitatively evaluate the circuit reliability design level of board-level electronic products, based on the four influencing factors of electrical stress derating design, tolerance design, signal/power integrity design and key function circuit design, the circuit reliability design evaluation method for board-level electronic products is proposed and application cases are given Firstly, based on the functional performance requirements and design information of the board-level circuit, the circuit reliability design evaluation criteria are proposed. Then, the evaluation parameters are extracted through simulation, testing, etc., and the reliability design level of the circuit is analyzed, and the quantitative evaluation results are given. Finally, the method is applied in the actual circuit, which proves the feasibility and effectiveness of the method.
电路板级电子产品电路可靠性设计评价方法
为了定量评价板级电子产品电路可靠性设计水平,基于电应力降额设计、公差设计、信号/功率完整性设计和关键功能电路设计四个影响因素,提出了板级电子产品电路可靠性设计评价方法,并给出了应用实例;根据电路板级电路的功能性能要求和设计信息,提出了电路可靠性设计评价标准。然后,通过仿真、测试等提取评估参数,分析电路的可靠性设计水平,并给出定量评估结果。最后,将该方法应用于实际电路,验证了该方法的可行性和有效性。
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