Invited talk: Resistive random access memory (RRAM): Materials and devices

W. Lu
{"title":"Invited talk: Resistive random access memory (RRAM): Materials and devices","authors":"W. Lu","doi":"10.1109/WMED.2013.6544498","DOIUrl":null,"url":null,"abstract":"Summary form only given. Nanoscale resistive memories (RRAMs) have generated extensive interest recently as a promising candidate for future non-volatile memory applications. In this talk, I will briefly summarize the current status of RRAM research, from the switching mechanism, modeling, material choice, performance metrics, to prototype memory demonstrations. Recently improved understanding of the resistance switching effects has led to improved device performance. However, challenges such as the tradeoff between programming current and retention still need to be overcome. Another major challenge for RRAM is the “sneak path” problem in the interconnected passive network, and proper “select” elements need to be developed to break the parasitic paths. Effective 3D integration techniques also need to be demonstrated. Different approaches to address these problems will be discussed.","PeriodicalId":134493,"journal":{"name":"2013 IEEE Workshop on Microelectronics and Electron Devices (WMED)","volume":"57 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Workshop on Microelectronics and Electron Devices (WMED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WMED.2013.6544498","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Summary form only given. Nanoscale resistive memories (RRAMs) have generated extensive interest recently as a promising candidate for future non-volatile memory applications. In this talk, I will briefly summarize the current status of RRAM research, from the switching mechanism, modeling, material choice, performance metrics, to prototype memory demonstrations. Recently improved understanding of the resistance switching effects has led to improved device performance. However, challenges such as the tradeoff between programming current and retention still need to be overcome. Another major challenge for RRAM is the “sneak path” problem in the interconnected passive network, and proper “select” elements need to be developed to break the parasitic paths. Effective 3D integration techniques also need to be demonstrated. Different approaches to address these problems will be discussed.
特邀演讲:电阻随机存取存储器(RRAM):材料和器件
只提供摘要形式。纳米级电阻存储器(rram)作为未来非易失性存储器应用的一个有前途的候选者,最近引起了广泛的兴趣。在这次演讲中,我将简要总结RRAM的研究现状,从开关机制、建模、材料选择、性能指标到原型存储器演示。最近对电阻开关效应的理解有所提高,从而提高了器件的性能。然而,我们仍然需要克服编程当前和留存率之间的权衡等挑战。RRAM面临的另一个主要挑战是互联无源网络中的“潜行路径”问题,需要开发适当的“选择”元件来打破寄生路径。有效的3D集成技术也需要证明。我们将讨论解决这些问题的不同方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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