{"title":"Cement-Based Materials Characterization at Nanoscale: Nanoindentation and Ultrasonic Atomic Force Microscopy (AFM)","authors":"Jae Hong Kim, P. Mondal, Surendra P. Shah","doi":"10.14359/51663739","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":387292,"journal":{"name":"SP-270: Advances in the Material Science of Concrete","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SP-270: Advances in the Material Science of Concrete","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.14359/51663739","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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