{"title":"Neutron Fluence Monitoring for Subsequent License Renewal","authors":"A. Patel, J. Risner, Benjamin Parks, M. Hardgrove","doi":"10.1520/STP160820170075","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":166400,"journal":{"name":"Reactor Dosimetry: 16th International Symposium","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Reactor Dosimetry: 16th International Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1520/STP160820170075","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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