Deriving Fault Locating Test Cases from Constrained Covering Arrays

Hao Jin, Tatsuhiro Tsuchiya
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引用次数: 7

Abstract

Combinatorial Interaction Testing (CIT) is a well practiced strategy for testing of software systems. Ordinary CIT detects faults caused by interactions of parameters but cannot locate faulty interactions. This paper addresses the problem of adding fault localization capability to CIT. This is done by means of fault locating suites of test cases, which are named constrained locating arrays. An algorithm that derives a constrained locating array from a test suite for ordinary CIT is proposed. Experimental results show that the new algorithm can construct constrained locating arrays for fairly large sized problem instances in reasonable time.
从约束覆盖阵列中导出故障定位测试用例
组合交互测试(CIT)是一种实践良好的软件系统测试策略。普通CIT可以检测到参数交互导致的故障,但无法定位故障交互。本文解决了在CIT中增加故障定位能力的问题,这是通过测试用例的故障定位套件来实现的,这些测试用例被称为约束定位阵列。提出了一种从普通CIT测试套件中提取约束定位数组的算法。实验结果表明,该算法可以在合理的时间内对较大规模的问题实例构造约束定位数组。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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