A method for FinFET intermodulation analysis from TCAD simulations using a time-domain waveform approach

F. Ahmad, M. S. Alam, G. A. Armstrong
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Abstract

FinFETs are very promising for integrated circuit low signal anolog applications. In this paper we present, non-linear analysis of this type of devices using technology CAD (TCAD), which complements the already done studies about the advantages and possibilities of source/drain extension (SDE) engineering of FinFET for anolog applications. This is a simple and fast way to predict linearity using TCAD at an early stage FinFET design process. The method is based on time domain waveforms at drain and gate terminals at different input power level. By carrying out spectrum analysis of time-domain signals and knowing fundamental power Pfund and third order harmonics ( IM3 ) power at different input power have been used to determine third-order intercept ( IP3 ). The value of IP3 obtained using approach is found to ∼4dBm at Vg = 0.25V and Vd = 1.1V . Further on Vg is varied at fixed Vd = 1.1V , and effect of Vg on 3 fund IM3 / Pfund is investigated.
用时域波形法分析TCAD仿真中FinFET互调的方法
finfet在集成电路低信号模拟应用中非常有前途。在本文中,我们使用CAD (TCAD)技术对这种类型的器件进行非线性分析,这补充了已经完成的关于模拟应用的FinFET源/漏极扩展(SDE)工程的优势和可能性的研究。这是在FinFET设计过程的早期阶段使用TCAD预测线性度的一种简单而快速的方法。该方法基于不同输入功率下漏极端和栅极端的时域波形。通过对时域信号进行频谱分析,了解不同输入功率下的基频功率Pfund和三阶谐波功率,确定三阶截距IP3。在Vg = 0.25V和Vd = 1.1V时,该方法获得的IP3值为~ 4dBm。在固定Vd = 1.1V时,进一步研究了Vg对3基IM3 / Pfund的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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