Tip-field-enhancement characterisation by field ion microscopy

Abstract

The interactions between a very fast and intense laser pulse and an object with sub-wavelength dimensions are still now well characterised. The tip field enhancement phenomenon is applied, for example, in the near-field microscopies or in nano-manipulation. But no model has enabled good prediction of the values of the enhanced field. We proposed a new method to measure the enhanced electric field, called effective electric field, at the apex of a tip using a field ion microscope.