{"title":"Adaptive Optocoupler Degradation Compensation in Isolated Feedback Loops","authors":"György Györök, Bertalan Beszédes","doi":"10.1109/SACI.2018.8440950","DOIUrl":null,"url":null,"abstract":"An optocoupler is an optoelectronic device, based on a light emitter and detector pair. Any degradation in the emitted light causes a change in the output of the component. This gain change is also known as CTR (current transfer ration) degradation,-although in some cases, the emitted light output actually increased over time. This phenomenon is inherent of the p-n junction electroluminescence and it is unpredictable. Excessive amount of degradation may cause a deviation from optimal operation or a catastrophic system failure. This paper puts forward a robust, microcontroller based solution for this problem.","PeriodicalId":126087,"journal":{"name":"2018 IEEE 12th International Symposium on Applied Computational Intelligence and Informatics (SACI)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 12th International Symposium on Applied Computational Intelligence and Informatics (SACI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SACI.2018.8440950","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
An optocoupler is an optoelectronic device, based on a light emitter and detector pair. Any degradation in the emitted light causes a change in the output of the component. This gain change is also known as CTR (current transfer ration) degradation,-although in some cases, the emitted light output actually increased over time. This phenomenon is inherent of the p-n junction electroluminescence and it is unpredictable. Excessive amount of degradation may cause a deviation from optimal operation or a catastrophic system failure. This paper puts forward a robust, microcontroller based solution for this problem.