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A metal-oxide-semiconductor devices reliability assessing method based on physics of failure

Safety and Reliability – Safe Societies in a Changing World Pub Date : 2018-06-15 DOI:10.1201/9781351174664-265
Hantian Gu, Ming Zhu, Wei Zhang, Lei Zhang, Hengjing Zhu, Ming Tang
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基于失效物理的金属氧化物半导体器件可靠性评估方法
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Safety and Reliability – Safe Societies in a Changing World
Safety and Reliability – Safe Societies in a Changing World
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