GPUburn: A system to test and mitigate GPU hardware failures

D. Defour, E. Petit
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引用次数: 13

Abstract

Due to many factors such as, high transistor density, high frequency, and low voltage, today's processors are more than ever subject to hardware failures. These errors have various impacts depending on the location of the error and the type of processor. Because of the hierarchical structure of the compute units and work scheduling, the hardware failure on GPUs affect only part of the application. In this paper we present a new methodology to characterize the hardware failures of Nvidia GPUs based on a software micro-benchmarking platform implemented in OpenCL. We also present which hardware part of TESLA architecture is more sensitive to intermittent errors, which usually appears when the processor is aging. We obtained these results by accelerating the aging process by running the processors at high temperature. We show that on GPUs, intermittent errors impact is limited to a localized architecture tile. Finally, we propose a methodology to detect, record location of defective units in order to avoid them to ensure the program correctness on such architectures, improving the GPU fault-tolerance capability and lifespan.
GPUburn:用于测试和减轻GPU硬件故障的系统
由于高晶体管密度、高频率和低电压等诸多因素,今天的处理器比以往任何时候都更容易受到硬件故障的影响。这些错误有不同的影响,取决于错误的位置和处理器的类型。由于计算单元的分层结构和工作调度,gpu上的硬件故障只影响部分应用程序。本文提出了一种基于OpenCL实现的软件微基准测试平台表征Nvidia gpu硬件故障的新方法。我们还介绍了TESLA架构的哪个硬件部分对间歇性错误更敏感,这种错误通常在处理器老化时出现。这些结果是通过使处理器在高温下加速老化得到的。我们表明,在gpu上,间歇性错误的影响仅限于局部架构块。最后,我们提出了一种检测、记录缺陷单元位置的方法,以避免缺陷单元的出现,从而确保程序在此类架构上的正确性,从而提高GPU的容错能力和使用寿命。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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