S. Cho, Hyuk-Hoon Shim, Jong-Hyeong Kim, Chun-Sam Song, Joon Hyun Kim, Won-Jong Joo
{"title":"Development of 3-D shapes estimation by using single X-ray image","authors":"S. Cho, Hyuk-Hoon Shim, Jong-Hyeong Kim, Chun-Sam Song, Joon Hyun Kim, Won-Jong Joo","doi":"10.1109/ISOT.2009.5326040","DOIUrl":null,"url":null,"abstract":"X-ray images are heavily affected by noise which makes normal image processing not workable. This paper suggested a new method to identify the primary 3-D shape of an embedded object and its pose by using only single X-ray image. The image feature consists of corner points and edge/intersection lines of adjacent surfaces. The intensity of an X-ray image is attenuated exponentially with increasing the penetration thickness. The main finding is to model a precise exponential relationship to fit the variation of X-ray image intensity. It applied a least-square-method to the X-ray projection image and effectively extracted edges and intersection lines from the noise of X-ray image.","PeriodicalId":366216,"journal":{"name":"2009 International Symposium on Optomechatronic Technologies","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Symposium on Optomechatronic Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISOT.2009.5326040","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
X-ray images are heavily affected by noise which makes normal image processing not workable. This paper suggested a new method to identify the primary 3-D shape of an embedded object and its pose by using only single X-ray image. The image feature consists of corner points and edge/intersection lines of adjacent surfaces. The intensity of an X-ray image is attenuated exponentially with increasing the penetration thickness. The main finding is to model a precise exponential relationship to fit the variation of X-ray image intensity. It applied a least-square-method to the X-ray projection image and effectively extracted edges and intersection lines from the noise of X-ray image.