A method for quick estimation of optimum bulk bias voltages for SoC designs

Lucas Santis, Ronald Valenzuela
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Abstract

A method for early estimation of optimum bulk bias potential is proposed. The suggested strategy removes the requirement for synthesis based exploration, greatly reducing Turn Around Time (TAT). As the core of the method, we present a linear model for estimating the Energy Delay Product (EDP), which relies on characterization of Static and Dynamic Energy, as well as Delay for a single Inverter cell under different bulk bias operating conditions. This model weights these vectors using design constraint parameters such as switching activity and clock period. We have validated the model by means of statistical analysis. The method was then tested by comparison of Quality of Results (QoR) obtained from implementation of an open source System on a Chip (SoC) design, first using our predicted bias voltages and then using an estimate of the optimum found by exploration over a post layout annotated Netlist. Our method has achieved a 6.3% of improvement on EDP with a very low TAT.
SoC设计中最佳体偏置电压的快速估计方法
提出了一种早期估计最佳体偏置电位的方法。建议的策略消除了基于综合的勘探需求,大大减少了周转时间(TAT)。作为该方法的核心,我们提出了一个估计能量延迟积(EDP)的线性模型,该模型依赖于静态和动态能量的表征,以及不同体偏置工作条件下单个逆变器电池的延迟。该模型使用设计约束参数(如切换活动和时钟周期)对这些向量进行加权。我们用统计分析的方法对模型进行了验证。然后,通过比较从开源芯片上系统(SoC)设计实现中获得的结果质量(QoR)来测试该方法,首先使用我们预测的偏置电压,然后使用通过探索post布局注释Netlist发现的最佳估计。我们的方法在非常低的TAT下实现了6.3%的EDP改进。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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