A microstrip slotted line for microwave two-port device characterization

Abstract

The electrical and mechanical design of a micro-strip slotted line will be described. By means of this line, large-signal input and output impedances, gain and conversion efficiency of two-port bipolar transistor, FET and CATT devices can be measured as a function of frequency and power level. Measurements with the new microstrip slotted line can be performed much more quickly and accurately than with the conventional method.