Shunt-peaking in MCML memory element design in 0.18μm CMOS technology

K. Gupta, N. Pandey, M. Gupta
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引用次数: 4

Abstract

This paper proposes a new active shunt-peaked realization for MOS Current Mode Logic (MCML) based memory element. The circuit proposes the use of active inductors in shunt-peaking of MCML memory element. The technique of shunt-peaking offers a way of enhancing the performance of gates at high speed of operations. The benefit of the proposed circuit is verified by designing and simulating various MCML based memory elements with resistive, PMOS, feedback and active inductor load. An overall performance evaluation in terms of setup time, hold time and propagation delay from clock-to-Q has been done in PSPICE using 0.18μm TSMC CMOS technology parameters. For a power supply of 3.3 V and clock frequency of 1 GHz, the simulation results show an improvement of 13 to 25 percent in the values of delay parameters for active shunt-peaked memory element in comparison to other existing MCML based designs.
基于0.18μm CMOS技术的MCML存储元件的并联峰值设计
本文提出了一种基于MOS电流模式逻辑(MCML)存储元件的有源并联尖峰实现方法。该电路提出在MCML存储元件的分路调峰中采用有源电感。并联调峰技术为提高栅极在高速运行时的性能提供了一种途径。通过设计和仿真各种基于MCML的具有电阻性、PMOS、反馈和有源电感负载的存储元件,验证了所提电路的优点。采用0.18μm TSMC CMOS技术参数,在PSPICE中进行了从时钟到q的设置时间、保持时间和传播延迟的综合性能评估。对于3.3 V电源和1 GHz时钟频率,仿真结果表明,与其他现有的基于MCML的设计相比,有源并联峰值存储元件的延迟参数值提高了13%至25%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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