A differential ellipsometric method for accurate chirality measurement

2016 IEEE Photonics Conference (IPC) Pub Date : 2016-10-01 DOI:10.1109/IPCON.2016.7831280

Guangcan Mi, V. Van

引用次数: 0

Abstract

We demonstrate a differential ellipsometric method for accurate measurement of chirality based on reflection near critical angle. The method is implemented in a commercial spectroscopic ellipsometer and allows for characterization of the optical rotatory dispersion.

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一种精确测量手性的微分椭偏法

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本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2016 IEEE Photonics Conference (IPC)

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