L. Lobanov, V.Ya. Znova, V. Savytskyi, I. Kyianets, O.P. Shutkevych
{"title":"Visualization of defects in aircraft structure elements by electron shearography method","authors":"L. Lobanov, V.Ya. Znova, V. Savytskyi, I. Kyianets, O.P. Shutkevych","doi":"10.37434/tdnk2022.03.02","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":126730,"journal":{"name":"Tehničeskaâ diagnostika i nerazrušaûŝij kontrolʹ","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Tehničeskaâ diagnostika i nerazrušaûŝij kontrolʹ","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.37434/tdnk2022.03.02","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}