Structural and Dielectric Investigations of Cerium Stabilized Zirconia (Zr1-xCexO2(x=0-0.05)) Nanocrystals Blended by Wet Chemical Method

H. C. Madhusudhana, S. N. Shobhadevi, B. Nagabhushana, R. Krishna, M. Murugendrappa, H. Nagabhushana
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引用次数: 1

Abstract

Cerium doped ZrO2 nano crystals (Zr1-xCexO2(x=0-0.05)) have been synthesized by solution combustion method using glycine as a fuel at furnace temperature 400 °C. The obtained samples are characterized by X-ray diffraction, scanning electron microscopy, and Fourier transform infrared spectroscopy, UV-Vis-spectroscopy and AC conductivity techniques. The XRD patterns exhibit decrease in crystallinity of the sample with increase in dopant concentration. The crystallite size is found to be 20-30 nm. The particle size is decreasing with Ce3+ concentration. The SEM analysis reveals change of porosity and shape of ZrO2 samples from spherical grain structure at 1 mol% of Ce3+ to irregular flake like structures in shape at 5 mol% of Ce3+. The band gap is decreasing from 4 to 3.3 eV as the doping concentration increases. AC impedance spectroscopy results of the as synthesized Ce doped ZrO2 shows good dielectric properties with a very high dielectric constant. Sample of ZrO2 doped with 5 mol% Ce3+ is found to have high dielectric constant (ɛʹ = 50) and the lowest dielectric constant (ɛʹ = 18) is found for undoped ZrO2 at 10 MHz. The lowest dielectric loss is measured for the sample having 5 mol% cerium doped zirconia.
湿化学法混合铈稳定氧化锆(Zr1-xCexO2(x=0-0.05))纳米晶的结构和介电性能研究
以甘氨酸为燃料,在400℃的炉温下,采用溶液燃烧法合成了掺杂铈的ZrO2纳米晶体(Zr1-xCexO2(x=0-0.05))。通过x射线衍射、扫描电子显微镜、傅里叶变换红外光谱、紫外可见光谱和交流电导技术对所得样品进行了表征。XRD谱图显示,随着掺杂剂浓度的增加,样品的结晶度降低。晶粒尺寸为20 ~ 30 nm。随着Ce3+浓度的增加,颗粒尺寸逐渐减小。SEM分析表明,ZrO2试样的孔隙率和形状发生了变化,从1 mol% Ce3+时的球形晶粒结构到5 mol% Ce3+时的不规则片状结构。随着掺杂浓度的增加,带隙从4 eV减小到3.3 eV。交流阻抗谱结果表明,合成的Ce掺杂ZrO2具有很高的介电常数,具有良好的介电性能。掺5mol % Ce3+的ZrO2样品在10 MHz时具有较高的介电常数(η = 50),未掺ZrO2样品的介电常数最低(η = 18)。测量了含有5 mol%铈掺杂氧化锆的样品的最低介电损耗。
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