An Adaptive Approach for defect Prediction using Dynamic Classifiers Selection

Ashutosh Upadhyay, Sushant Kumar Pandey, A. Tripathi
{"title":"An Adaptive Approach for defect Prediction using Dynamic Classifiers Selection","authors":"Ashutosh Upadhyay, Sushant Kumar Pandey, A. Tripathi","doi":"10.1109/ICKECS56523.2022.10059946","DOIUrl":null,"url":null,"abstract":"Software Defect Prediction (SDP) approaches use learning methods to classify classes/module/files into the defective or non-defective or provide the possibility that a class can show faulty behaviors in the future. Since there are several classifiers that can give optimal results using ensemble learning methods, they are developed to estimate the defect-proneness of a class by combining prediction outcomes obtained from different classifiers. We are employing an ensemble learning technique and building an adaptive approach for performing bug prediction by dynamically selecting one classifier from a set of machine learning classifiers, that predicts if a class is bug prone or not based on characteristics of static software metrics captured for class. We are proposing a new Adaptive Approach for Bug Prediction using Dynamically Classifier Selection (ADCS) which dynamically selects the best base learning that better predicts bug-proneness of a class based on characteristics of the class. We have used datasets obtained from the PROMISE repository (developed by NASA) for 30 Software system. Our results indicates that ADCS perform better compared to 5 different classifiers which are used to predict bug-proneness independently and when Validation and Voting (VV) ensemble technique used to combine classifiers output with majority voting. We found that the ADCS outperforms in 26 projects and avoids class imbalance and overfitting problems.","PeriodicalId":171432,"journal":{"name":"2022 International Conference on Knowledge Engineering and Communication Systems (ICKES)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-12-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Knowledge Engineering and Communication Systems (ICKES)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICKECS56523.2022.10059946","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Software Defect Prediction (SDP) approaches use learning methods to classify classes/module/files into the defective or non-defective or provide the possibility that a class can show faulty behaviors in the future. Since there are several classifiers that can give optimal results using ensemble learning methods, they are developed to estimate the defect-proneness of a class by combining prediction outcomes obtained from different classifiers. We are employing an ensemble learning technique and building an adaptive approach for performing bug prediction by dynamically selecting one classifier from a set of machine learning classifiers, that predicts if a class is bug prone or not based on characteristics of static software metrics captured for class. We are proposing a new Adaptive Approach for Bug Prediction using Dynamically Classifier Selection (ADCS) which dynamically selects the best base learning that better predicts bug-proneness of a class based on characteristics of the class. We have used datasets obtained from the PROMISE repository (developed by NASA) for 30 Software system. Our results indicates that ADCS perform better compared to 5 different classifiers which are used to predict bug-proneness independently and when Validation and Voting (VV) ensemble technique used to combine classifiers output with majority voting. We found that the ADCS outperforms in 26 projects and avoids class imbalance and overfitting problems.
基于动态分类器选择的自适应缺陷预测方法
软件缺陷预测(SDP)方法使用学习方法将类/模块/文件分类为有缺陷的或无缺陷的,或者提供类在未来可能显示错误行为的可能性。由于有几种分类器可以使用集成学习方法给出最佳结果,因此开发了这些分类器,通过组合从不同分类器获得的预测结果来估计类的缺陷倾向。我们正在采用集成学习技术,并通过从一组机器学习分类器中动态选择一个分类器来构建一种自适应方法来执行错误预测,该分类器根据为类捕获的静态软件度量的特征来预测一个类是否容易出现错误。本文提出了一种基于动态分类器选择(ADCS)的自适应Bug预测方法,该方法根据类的特征动态选择最优的基学习来更好地预测类的Bug倾向。我们使用了30 Software系统从PROMISE存储库(由NASA开发)获得的数据集。我们的结果表明,当使用验证和投票(VV)集成技术将分类器输出与多数投票相结合时,与用于独立预测漏洞倾向的5种不同分类器相比,ADCS表现更好。我们发现ADCS在26个项目中表现优异,避免了类别不平衡和过拟合问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信