{"title":"Mitigation of CMOS Device Variability in Digital RF Processor","authors":"K. Waheed, R. Staszewski","doi":"10.1201/9781420070637.CH21","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":447843,"journal":{"name":"Circuits at the Nanoscale","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Circuits at the Nanoscale","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781420070637.CH21","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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