Safe microcontrollers with error protection encoder-decoder using bit-inversion techniques for on-chip flash integrity verification

Daejin Park, T. Kim
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引用次数: 8

Abstract

The code memory integrity of embedded NOR flash memory in the microcontrollers is becoming important for applications requiring safety-critical operations like automotive ICs. Software-driven or hardware supports for the memory protection are required to guarantee the safe-conscious code execution of the downloaded firmware in microcontrollers. The protection method requires more power consumption in the ECC decoding for the code-words. In this paper, the protection hardware in the read-path of the embedded NOR flash memory in the microcontrollers chip is proposed to improve the power consumption with a small amount of logic gates overhead. The conventional error correction code (ECC) hardware data path is integrated with our newly-designed binary bit-inversion decoder with zero overhead inversion flags to decrease the power consumption in decoding the binary code blocks. The 1 bits error correction using 8 bits ECC parity code per 64 bits code blocks (72:64 SEC-DED) are applied to 64KB embedded NOR flash memory with the separated region of the flash memory for error correction padding bits.
安全微控制器与错误保护编码器-解码器使用位反转技术片上闪存完整性验证
微控制器中嵌入式NOR闪存的代码存储器完整性对于需要安全关键操作的应用(如汽车集成电路)变得越来越重要。需要软件驱动或硬件支持内存保护,以保证在微控制器中下载的固件的安全意识代码执行。该保护方法对码字的ECC译码功耗较大。本文提出了在微控制器芯片中嵌入式NOR快闪存储器的读径保护硬件,以减少逻辑门的开销来提高功耗。将传统的纠错码(ECC)硬件数据路径与我们新设计的零开销反转标志二进制位反转解码器集成在一起,降低了二进制码块解码的功耗。每64位码块使用8位ECC奇偶校验码(72:64 SEC-DED)的1位纠错应用于64KB嵌入式NOR闪存,闪存的分隔区域用于纠错填充位。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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