{"title":"Safe microcontrollers with error protection encoder-decoder using bit-inversion techniques for on-chip flash integrity verification","authors":"Daejin Park, T. Kim","doi":"10.1109/GCCE.2013.6664833","DOIUrl":null,"url":null,"abstract":"The code memory integrity of embedded NOR flash memory in the microcontrollers is becoming important for applications requiring safety-critical operations like automotive ICs. Software-driven or hardware supports for the memory protection are required to guarantee the safe-conscious code execution of the downloaded firmware in microcontrollers. The protection method requires more power consumption in the ECC decoding for the code-words. In this paper, the protection hardware in the read-path of the embedded NOR flash memory in the microcontrollers chip is proposed to improve the power consumption with a small amount of logic gates overhead. The conventional error correction code (ECC) hardware data path is integrated with our newly-designed binary bit-inversion decoder with zero overhead inversion flags to decrease the power consumption in decoding the binary code blocks. The 1 bits error correction using 8 bits ECC parity code per 64 bits code blocks (72:64 SEC-DED) are applied to 64KB embedded NOR flash memory with the separated region of the flash memory for error correction padding bits.","PeriodicalId":294532,"journal":{"name":"2013 IEEE 2nd Global Conference on Consumer Electronics (GCCE)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 2nd Global Conference on Consumer Electronics (GCCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GCCE.2013.6664833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
The code memory integrity of embedded NOR flash memory in the microcontrollers is becoming important for applications requiring safety-critical operations like automotive ICs. Software-driven or hardware supports for the memory protection are required to guarantee the safe-conscious code execution of the downloaded firmware in microcontrollers. The protection method requires more power consumption in the ECC decoding for the code-words. In this paper, the protection hardware in the read-path of the embedded NOR flash memory in the microcontrollers chip is proposed to improve the power consumption with a small amount of logic gates overhead. The conventional error correction code (ECC) hardware data path is integrated with our newly-designed binary bit-inversion decoder with zero overhead inversion flags to decrease the power consumption in decoding the binary code blocks. The 1 bits error correction using 8 bits ECC parity code per 64 bits code blocks (72:64 SEC-DED) are applied to 64KB embedded NOR flash memory with the separated region of the flash memory for error correction padding bits.