{"title":"Novel Conception of Loss Tangent Media Measurement with Laser-Driven Gallium Arsenide Switches","authors":"M. Kulygin, E. Novikov, I. Litovsky, R. Rozental","doi":"10.1109/COMCAS44984.2019.8958380","DOIUrl":null,"url":null,"abstract":"A conception of using laser-driven resonator cavity switches with an active element of semiconductor to measure the semiconductor's loss tangent being unknown is proposed and discussed. A sample calculation for an existent gallium arsenide-based prototype for the frequencies around 300 GHz has demonstrated an unambiguous determination of the loss tangent in the range of at least four orders and two methods. Such a redundancy helps to come over a fabrication imprecision for each prototype and ensure high precision of measurements.","PeriodicalId":276613,"journal":{"name":"2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMCAS44984.2019.8958380","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A conception of using laser-driven resonator cavity switches with an active element of semiconductor to measure the semiconductor's loss tangent being unknown is proposed and discussed. A sample calculation for an existent gallium arsenide-based prototype for the frequencies around 300 GHz has demonstrated an unambiguous determination of the loss tangent in the range of at least four orders and two methods. Such a redundancy helps to come over a fabrication imprecision for each prototype and ensure high precision of measurements.