A fully-differential subthreshold SRAM cell with auto-compensation

Mu-Tien Chang, W. Hwang
{"title":"A fully-differential subthreshold SRAM cell with auto-compensation","authors":"Mu-Tien Chang, W. Hwang","doi":"10.1109/APCCAS.2008.4746384","DOIUrl":null,"url":null,"abstract":"SRAM cell stability is a major challenge in subthreshold SRAM design. In this paper, a robust, fully-differential subthreshold 10-transistors SRAM cell with auto-compensation is proposed. With the auto-compensation mechanism, the proposed cell exhibits better hold static noise margin (SNM). The cell structure also prevents storage nodes from bitline noise interference, thus improving read SNM. Moreover, better write ability is achieved by applying write assist technique. Based on UMC 90 nm CMOS technology, simulation results shows that at 200 mV supply voltage, the proposed cell has 1.22X hold SNM improvement, 2.09X read SNM improvement, and 2.03X write margin improvement compared to the conventional 6T SRAM cell.","PeriodicalId":344917,"journal":{"name":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems","volume":"44 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APCCAS.2008.4746384","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

Abstract

SRAM cell stability is a major challenge in subthreshold SRAM design. In this paper, a robust, fully-differential subthreshold 10-transistors SRAM cell with auto-compensation is proposed. With the auto-compensation mechanism, the proposed cell exhibits better hold static noise margin (SNM). The cell structure also prevents storage nodes from bitline noise interference, thus improving read SNM. Moreover, better write ability is achieved by applying write assist technique. Based on UMC 90 nm CMOS technology, simulation results shows that at 200 mV supply voltage, the proposed cell has 1.22X hold SNM improvement, 2.09X read SNM improvement, and 2.03X write margin improvement compared to the conventional 6T SRAM cell.
具有自动补偿功能的全差分亚阈值SRAM单元
SRAM单元的稳定性是亚阈值SRAM设计的主要挑战。本文提出了一种鲁棒的、具有自补偿功能的全差分亚阈值10晶体管SRAM单元。通过自补偿机制,该单元具有较好的静态噪声裕度(SNM)。单元结构还可以防止存储节点受到位线噪声的干扰,从而提高读SNM。此外,通过应用写辅助技术,提高了系统的写能力。仿真结果表明,在200 mV供电电压下,与传统的6T SRAM电池相比,该电池的保持SNM提高1.22倍,读SNM提高2.09倍,写余量提高2.03倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信