Validation of RF mosfet transistor layout-aware macromodel

A. El-Sabban, H. Haddara, H. Ragai
{"title":"Validation of RF mosfet transistor layout-aware macromodel","authors":"A. El-Sabban, H. Haddara, H. Ragai","doi":"10.1109/ICEEC.2004.1374519","DOIUrl":null,"url":null,"abstract":"In this paper, an overview of a layout-aware macromodel for the BSIM3v3 MOSFET transistor in RF applications is presented. This layout-aware macromodel includes all the terminal access series resistences including substrate as well as the junction capacitances. It can be used for circuit simulation at RF up to 6GHz. The model is validated for a 0. 3 5 ~ CMOS process using a transistor with total width of 9 0 p and 18 fingers. The simulation results show an excellent agreement with the fi and S-parameter measurement data. The layout-aware macromodel presented in this paper can be easily modified to account for various layout transistor structures and technology parameters depending on the required application.","PeriodicalId":180043,"journal":{"name":"International Conference on Electrical, Electronic and Computer Engineering, 2004. ICEEC '04.","volume":"28 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Electrical, Electronic and Computer Engineering, 2004. ICEEC '04.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEEC.2004.1374519","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

In this paper, an overview of a layout-aware macromodel for the BSIM3v3 MOSFET transistor in RF applications is presented. This layout-aware macromodel includes all the terminal access series resistences including substrate as well as the junction capacitances. It can be used for circuit simulation at RF up to 6GHz. The model is validated for a 0. 3 5 ~ CMOS process using a transistor with total width of 9 0 p and 18 fingers. The simulation results show an excellent agreement with the fi and S-parameter measurement data. The layout-aware macromodel presented in this paper can be easily modified to account for various layout transistor structures and technology parameters depending on the required application.
射频场效应晶体管布局感知宏模型的验证
本文概述了用于射频应用的BSIM3v3 MOSFET晶体管的布局感知宏模型。该布局感知宏模型包括所有终端接入串联电阻,包括基板和结电容。它可以用于高达6GHz的射频电路仿真。模型验证为0。3 5 ~ CMOS工艺采用总宽度为9 0 p的晶体管和18指。仿真结果与fi和s参数测量数据吻合良好。本文提出的布局感知宏模型可以很容易地修改,以考虑不同的布局晶体管结构和技术参数,这取决于所需的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信