Effect of slot edge defects on the head/tape spacing

B. Garrettson, S. Tan, A. Lakshmikumaran, F. Talke
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引用次数: 4

Abstract

The effect of slot edge defects on the performance of the head/tape interface is studied for single and double module heads. A number of typical edge defects was created artificially on a glass replica of an actual head, and three-wavelength interferometry was used to study spacing changes caused by these defects. The results show that head edge defects have a small influence on the flying behavior of tape with the effects being localized to the immediate defect area.
槽边缺陷对磁头/磁带间距的影响
研究了单、双模块磁头槽边缺陷对磁头/磁带接口性能的影响。在实际头部的玻璃复制品上人工制造了一些典型的边缘缺陷,并使用三波长干涉测量法研究了这些缺陷引起的间距变化。结果表明,头部边缘缺陷对胶带的飞行行为影响较小,且影响局限于直接缺陷区域。
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