A newly developed model for stress induced slit-like voiding

28th Annual Proceedings on Reliability Physics Symposium Pub Date : 1990-03-27 DOI:10.1109/RELPHY.1990.66086

H. Kaneko, M. Hasunuma, A. Sawabe, T. Kawanoue, Y. Kohanawa, S. Komatsu, M. Miyauchi

引用次数: 14

Abstract

Thermodynamic analysis of stress-induced voiding has indicated that a slit-like void is the origin of metal line open failures. Wedge-shaped voids nucleate initially at specific grain boundaries where

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新建立的应力诱导裂隙状空化模型

应力诱导空化的热力学分析表明，裂隙型空化是金属线开口破坏的根源。楔形孔洞最初在特定晶界处成核

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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28th Annual Proceedings on Reliability Physics Symposium

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