{"title":"A local analysis of the genotype-fitness mapping in hardware optimization problems","authors":"E. Sánchez, Giovanni Squillero, M. Violante","doi":"10.1109/CEC.2004.1330952","DOIUrl":null,"url":null,"abstract":"This paper suggests a framework to examine, evaluate and characterize an evolutionary test-program generation problem. The methodology exploits the definition of distance functions at the genotypic and phenotypic levels to perform a local analysis of an unknown space. A hardware accelerator device is used for speeding up test-program evaluations. A complex microprocessor was used as case study. Experiments show how the local analysis allowed discovering several characteristics of the task and foreseeing the behavior of the test-program generation.","PeriodicalId":152088,"journal":{"name":"Proceedings of the 2004 Congress on Evolutionary Computation (IEEE Cat. No.04TH8753)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2004 Congress on Evolutionary Computation (IEEE Cat. No.04TH8753)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEC.2004.1330952","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper suggests a framework to examine, evaluate and characterize an evolutionary test-program generation problem. The methodology exploits the definition of distance functions at the genotypic and phenotypic levels to perform a local analysis of an unknown space. A hardware accelerator device is used for speeding up test-program evaluations. A complex microprocessor was used as case study. Experiments show how the local analysis allowed discovering several characteristics of the task and foreseeing the behavior of the test-program generation.