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COMPUTER SIMULATION OF HIGH-RESOLUTION ELECTRON MICROSCOPE IMAGES OF LAMELLAR BOUNDARIES IN TiAl

Computer Aided Innovation of New Materials Pub Date : 1900-01-01 DOI:10.1016/B978-0-444-88864-8.50180-1
H. Inui, A. Nakamura, M. Oh, M. Yamaguchi
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TiAl中片层边界的高分辨率电子显微镜图像的计算机模拟
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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Computer Aided Innovation of New Materials
Computer Aided Innovation of New Materials
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