A2DTest: A complete integrated solution for on-chip ADC self-test and analysis

2009 International Test Conference Pub Date : 2009-12-18 DOI:10.1109/TEST.2009.5355722

Brendan Mullane, Vincent O’Brien, Ciaran MacNamee, Thomas Fleischmann

引用次数: 4

Abstract

An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.

查看原文本刊更多论文

A2DTest:片上ADC自测和分析的完整集成解决方案

提出了一种片上BIST解决方案，可实现精确的ADC测量。该平台可以同时进行线性和动态测试，大大降低了测试时间和成本。片上硬件资源针对ADC测试应用进行了优化。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

2009 International Test Conference

自引率

0.00%

发文量